Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5423599 | Surface Science | 2010 | 4 Pages |
Abstract
Synchrotron radiation based photoemission spectroscopy (SRPES) and low energy electron diffraction (LEED) are used to study the interaction between Ag atoms and the Si(1Â 1Â 1)1Â ÃÂ 1-H surface. At an Ag coverage of 0.063 monolayers (ML) on the Si(1Â 1Â 1)1Â ÃÂ 1-H surface, the Si 2p component corresponding to Si-H bonds decreases, and an additional Si 2p component appears which shifts to a lower binding energy by 109Â meV with respect to the Si bulk peak. The new Si 2p component is also observed for 0.25Â ML Ag on the Si(1Â 1Â 1)7Â ÃÂ 7 surface. These findings suggest that Ag atoms replace the H atoms of the Si(1Â 1Â 1)1Â ÃÂ 1-H surface and form direct Ag-Si bonds. Contrary to the widely accepted view that there is no chemical interaction between Ag particles and the H-passivated Si surface, these results are in good agreement with recent first-principles calculations.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
J.-H. Han, H.-N. Hwang, H.-G. Jee, B. Kim, S. Chung, Y.D. Kim, C.-C. Hwang,