| Article ID | Journal | Published Year | Pages | File Type | 
|---|---|---|---|---|
| 5423599 | Surface Science | 2010 | 4 Pages | 
Abstract
												Synchrotron radiation based photoemission spectroscopy (SRPES) and low energy electron diffraction (LEED) are used to study the interaction between Ag atoms and the Si(1 1 1)1 Ã 1-H surface. At an Ag coverage of 0.063 monolayers (ML) on the Si(1 1 1)1 Ã 1-H surface, the Si 2p component corresponding to Si-H bonds decreases, and an additional Si 2p component appears which shifts to a lower binding energy by 109 meV with respect to the Si bulk peak. The new Si 2p component is also observed for 0.25 ML Ag on the Si(1 1 1)7 Ã 7 surface. These findings suggest that Ag atoms replace the H atoms of the Si(1 1 1)1 Ã 1-H surface and form direct Ag-Si bonds. Contrary to the widely accepted view that there is no chemical interaction between Ag particles and the H-passivated Si surface, these results are in good agreement with recent first-principles calculations.
											Keywords
												
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											Authors
												J.-H. Han, H.-N. Hwang, H.-G. Jee, B. Kim, S. Chung, Y.D. Kim, C.-C. Hwang, 
											