| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5423659 | Surface Science | 2011 | 5 Pages |
Abstract
⺠An analysis tool for depth profiling bimetallic nanoparticles with MEIS. ⺠Near monolayer resolution enables the detection of segregation effects. ⺠AuPd particles on silica form Au rich shells and Pd rich cores.
Related Topics
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Authors
Johan Gustafson, Andrew R. Haire, Christopher J. Baddeley,