Photoelectron spectroscopy (PES) and photoelectron diffraction (XPD) studies on the local adsorption of cyclopentene on Si(100)

We investigated the chemical and geometrical characteristics of the system cyclopentene on Si(100) in a combined photoelectron spectroscopy (PES) and photoelectron diffraction (XPD) investigation. In this study synchrotron radiation was applied to achieve a high resolution with high surface sensitivity. Our PES and XPD results show that the cyclopentene reacts with the silicon dimers of the (2 × 1)-reconstructed surface, changing the planar molecule to a diverse tilted molecule after the adsorption.