Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5423729 | Surface Science | 2010 | 5 Pages |
Abstract
Bias-dependent features of the insulating NaCl layer grown on Cu(001) have been investigated by scanning tunneling microscopy/spectroscopy (STM/STS). The apparent layer thickness of the NaCl film is variable at bias voltages ranging from 2.8 to 3.2Â V as well as from 4.0 to 5.0Â V, and the Moiré pattern induced by NaCl-Cu lattice mismatch also shows bias dependence. The z-V (dz/dV-V) curves and dI/dV mapping measurements reveal that the resonant tunneling between the image potential states (IPSs) on Cu(001) and the Fermi level of the STM tip leads to drastic variations of these features.
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Authors
Qinmin Guo, Zhihui Qin, Cunding Liu, Kan Zang, Yinghui Yu, Gengyu Cao,