Article ID Journal Published Year Pages File Type
5423729 Surface Science 2010 5 Pages PDF
Abstract
Bias-dependent features of the insulating NaCl layer grown on Cu(001) have been investigated by scanning tunneling microscopy/spectroscopy (STM/STS). The apparent layer thickness of the NaCl film is variable at bias voltages ranging from 2.8 to 3.2 V as well as from 4.0 to 5.0 V, and the Moiré pattern induced by NaCl-Cu lattice mismatch also shows bias dependence. The z-V (dz/dV-V) curves and dI/dV mapping measurements reveal that the resonant tunneling between the image potential states (IPSs) on Cu(001) and the Fermi level of the STM tip leads to drastic variations of these features.
Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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