Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5423969 | Surface Science | 2010 | 5 Pages |
Abstract
We report a novel approach for distinguishing surface, bulk and space-charge layer conductivities of metalized semiconductor surfaces. The method employs current injection from the tip of a scanning tunneling microscope and a spring-contact electrode placed on the surface in situ in UHV. The current-voltage behavior is sensitive to polarity in a way that distinguishes the surface contribution. The method is illustrated for the Si(1Â 1Â 1) 7Â ÃÂ 7 metallized surface and dependence of the conductivity with changing thickness of silver overlayers.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Hyosig Won, Roy F. Willis,