Article ID Journal Published Year Pages File Type
5423969 Surface Science 2010 5 Pages PDF
Abstract

We report a novel approach for distinguishing surface, bulk and space-charge layer conductivities of metalized semiconductor surfaces. The method employs current injection from the tip of a scanning tunneling microscope and a spring-contact electrode placed on the surface in situ in UHV. The current-voltage behavior is sensitive to polarity in a way that distinguishes the surface contribution. The method is illustrated for the Si(1 1 1) 7 × 7 metallized surface and dependence of the conductivity with changing thickness of silver overlayers.

Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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