Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5424186 | Surface Science | 2009 | 7 Pages |
Abstract
The tip-sample distance (z) dependence of tip-enhanced Raman scattering (TERS) has been investigated. The intensities of both, the Raman lines and the broad TERS background, exhibit strong decays with increasing z, which are nearly complete within 10Â nm withdrawal of the STM tip in z direction. Interestingly, the maximum of the broad Lorentzian-shaped TER background is substantially blue shifted in energy with z. This effect is ascribed to a corresponding blue shift of the energies of localized plasmon modes upon tip retraction. Both experimental results fit very well data of a simple theoretical near-field model.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Bruno Pettinger, Katrin F. Domke, Dai Zhang, Gennaro Picardi, Rolf Schuster,