Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5424435 | Surface Science | 2008 | 4 Pages |
Abstract
Low energy electron diffraction shows a (â3 Ã â3)R30° reconstruction on O-polar ZnO surfaces after a tube furnace annealing process commonly used to create atomic-height steps. This reconstruction is also produced in situ under conditions having an extremely low hydrogen background. X-ray photoelectron spectroscopy suggests H stabilizes the (1 Ã 1) termination that has been extensively reported. The (â3 Ã â3)R30° reconstruction is stable against H2, N2, and air, although its formation is suppressed when preparation occurs under a H2 background. Therefore, caution must be taken when using annealed O-polar ZnO substrates, as reconstruction will affect the nature of the surface and, thus, the growth interface.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
S.T. King, S.S. Parihar, K. Pradhan, H.T. Johnson-Steigelman, P.F. Lyman,