Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5424611 | Surface Science | 2008 | 6 Pages |
Abstract
We performed scanning tunneling microscopy/spectroscopy measurements and spatial mapping of dI/dV on a few atomic layers of bismuth (Bi) film on a Si(1Â 1Â 1)â(7Â ÃÂ 7) substrate. At a Bi coverage of four monolayers (ML), local thickness variation could be measured due to thickness dependence of the surface states. At the nominal coverage of 6.5Â ML, the dI/dV map reveals the subsurface structures, such as substrate step edges and buried Bi islands. The subsurface structures could be observed at specific biases, by both the electronic interference in a Bi film and the variation of the Bi surface states as a function of the film thickness.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Youngtek Oh, Jungpil Seo, Hwansoo Suh, Jung Seok Seo, Se-Jong Kahng, Young Kuk,