Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5424924 | Surface Science | 2007 | 11 Pages |
Abstract
We demonstrate that high-energy, high-resolution reflection electron energy loss spectroscopy can provide unique insights into interface formation, especially for the case where an extended interface is formed. By changing the geometry and/or electron energy the electronic structure can be probed over a range of thicknesses (from 10s of à to more than 1000 à ). At the same time one resolves the elastically scattered electrons into different components, corresponding to scattering of atoms with different mass (so-called 'electron Rutherford backscattering'). Thus these high-energy REELS/elastic scattering experiments obtain information on both the electronic structure and the atomic composition of the overlayer formed.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
M. Vos, M.R. Went,