Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5425238 | Surface Science | 2006 | 5 Pages |
Abstract
In this letter, atomically resolved scanning tunneling microscopic (STM) images obtained from monolayer SiO2/Mo(1Â 1Â 2) are presented. The results are consistent with a previously proposed structural model of isolated [SiO4] units based on vibrational features observed by high-resolution electron energy loss spectroscopy (HREELS) and infrared reflection-absorption spectroscopy (IRAS), and oxygen species identified by ultra-violet photoemission spectroscopy (UPS). These results are inconsistent with a structural model that assumes a two-dimensional (2-D) [Si-O-Si] network. These data illustrate that a metal substrate, although coated with an oxide thin layer, can be directly imaged at the atomic-scale with STM.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Mingshu Chen, D. Wayne Goodman,