Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5425558 | Surface Science | 2007 | 6 Pages |
Abstract
Lumogen® Yellow S0790 films have been produced on silicon wafer substrates via physical vapour deposition (PVD) and spin-coating (SC) methods. These coatings were characterised with X-ray reflectometry (XRR) and grazing incidence X-ray diffraction (GIXD) techniques. The results show that ultra-thin (less than 12Â nm) PVD films coat amorphously, with crystallinity becoming increasingly apparent with increasing film thickness. In contrast, measurements of ultra-thin (less than â¼2Â nm) spin-coated films reveal a second, apparently stable crystalline structure.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
S.J. Keough, T.L. Hanley, A.B. Wedding, J.S. Quinton,