Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5425704 | Surface Science | 2006 | 6 Pages |
Electronic and structural properties of Bi-terminated reconstructions on GaAs(0 0 1) surface have been studied by scanning tunneling microscopy (STM) and synchrotron radiation core-level spectroscopy. A 2-3 monolayer thick Bi-layer was evaporated on a Ga-terminated GaAs(0 0 1) surface. By heating the surface, the reconstruction changed from (2 Ã 1) to (2 Ã 4). The α2 phase with one top Bi dimer and one As or Bi dimer in the third atomic layer per surface unit cell is proposed to explain the STM images of the Bi/GaAs(0 0 1)(2 Ã 4) surface heated at 400 °C. Bi 5d photoemission from the Bi/GaAs(2 Ã 4) consisted of two components suggesting two different bonding sites for Bi atoms on the (2 Ã 4) surface. The variation of the surface sensitivity of the photoemission induced no changes in the intensities of the components indicating that the origins of both components lie in the first surface layer.