Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5425708 | Surface Science | 2006 | 6 Pages |
A sputter-cleaned indium-rich (2Â ÃÂ 4) InP(0Â 0Â 1) surface was investigated by non-contact scanning atomic force microscopy (NCAFM). Atomically-resolved images of the surface exhibit two different patterns. The patterns can be interpreted within the mixed dimer model of (2Â ÃÂ 4) reconstructed InP(0Â 0Â 1) surface. It is shown that due to contrast formation mechanism in NCAFM the features resolved are in close correspondence to scanning tunnelling microscopy (STM) data. Due to chemical interaction a P-terminated tip gives the image similar to an empty-state STM image, whereas an In-terminated tip gives the image resembling a filled-state STM one. Moreover, it is shown that due to dipole-dipole interaction, NCAFM can be sensitive to orientation of In-P dimers.