Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5425972 | Surface Science | 2006 | 6 Pages |
Abstract
We have identified, by means of synchrotron radiation X-ray photoemission spectroscopy, several core-level shifted components in the Si-2p photoemission core level peak from a thin yttrium silicide layer epitaxially grown on a Si(1Â 1Â 1) surface. We have unequivocally assigned these components to different environments of the Si atoms in the silicide structure. This information has been used to monitor a surface oxidation process promoted by room temperature oxygen adsorption, identifying the final product of this reaction as a silicate-type ternary compound.
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Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
C. Rogero, S. Lizzit, A. Goldoni, J.A. MartÃn-Gago,