Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5426223 | Surface Science | 2007 | 6 Pages |
Abstract
AFM, STM and diffraction of He and H2 have been used to assess Si(1Â 1Â 1)-H(1Â ÃÂ 1) surfaces for their potential as mirrors for matter-waves. The H-passivated samples are produced by wet-chemical methods and delivered to a different laboratory for diffraction measurements. We show that the surface is flat and homogenous over lateral scales of microns and that absolute He and H2 reflectivities of the order of â¼3% are obtained, even after 20Â h storage under Ar and several days' storage in UHV. These characteristics allow the use of Si(1Â 1Â 1)-H(1Â ÃÂ 1) as a highly reflective mirror for atoms and molecules, with application in a future He microscope or focused hydrogen nano-lithography system.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
D. Barredo, F. Calleja, A.E. Weeks, P. Nieto, J.J. Hinarejos, G. Laurent, A.L. Vazquez de Parga, D.A. MacLaren, D. FarÃas, W. Allison, R. Miranda,