Si(1 1 1)-H(1 × 1): A mirror for atoms characterized by AFM, STM, He and H2 diffraction

AFM, STM and diffraction of He and H2 have been used to assess Si(1 1 1)-H(1 × 1) surfaces for their potential as mirrors for matter-waves. The H-passivated samples are produced by wet-chemical methods and delivered to a different laboratory for diffraction measurements. We show that the surface is flat and homogenous over lateral scales of microns and that absolute He and H2 reflectivities of the order of ∼3% are obtained, even after 20 h storage under Ar and several days' storage in UHV. These characteristics allow the use of Si(1 1 1)-H(1 × 1) as a highly reflective mirror for atoms and molecules, with application in a future He microscope or focused hydrogen nano-lithography system.