| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5426273 | Surface Science | 2006 | 7 Pages |
Abstract
A Monte Carlo simulation is described and utilized to calculate the energy distribution spectra of the electrons backscattered by silicon dioxide. Spectra are presented for incident energies of 250Â eV, 500Â eV, and 1000Â eV. Spectra interpretation is based on a semiquantitative valence-band structure model for SiO2 crystals.
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
Maurizio Dapor,