Article ID Journal Published Year Pages File Type
5426454 Surface Science 2006 4 Pages PDF
Abstract

The structure of ultrathin epitaxial Fe films grown on Cu(0 0 1) at room temperature is investigated by grazing scattering of fast H and He atoms. By making use of ion beam triangulation, direct information on the atomic structure of the film and substrate surfaces are obtained. We discuss a new variant of this method based on the detection of the number of emitted electrons. The data is analyzed via computer simulations using classical mechanics which provides a quantitative analysis with respect to projectile trajectories.

Related Topics
Physical Sciences and Engineering Chemistry Physical and Theoretical Chemistry
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