Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5426563 | Surface Science | 2007 | 4 Pages |
Abstract
We present a detailed investigation of the electronic properties of C60 grown on GaAs(1Â 0Â 0) substrates, as a function of the fullerene coverage, from the very early stages of interface formation up to the development of a bulk-like fullerene film. We monitor the chemical interactions and the energy levels alignment by means of X-rays, ultraviolet and inverse photoemission spectroscopies. The two latter techniques allow to investigate the electronic structure close to the Fermi level. Energy levels alignment at the interfaces of C60 with p-doped and GaAs(1Â 0Â 0) are obtained and discussed.
Keywords
Related Topics
Physical Sciences and Engineering
Chemistry
Physical and Theoretical Chemistry
Authors
A. Brambilla, P. Sessi, L. Duò, M. Finazzi, J. Cabanillas-Gonzalez, H.-J. Egelhaaf, G. Lanzani, F. Ciccacci,