| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5426815 | Surface Science | 2006 | 6 Pages |
Abstract
Nano-sized P4P (para-quaterphenylene) organic crystallites grown on a gold substrate were removed and redeposited using the tip of an STM. The controlled lift-off of the needle-shaped crystallites was imaged by a simultaneously operated SEM. The forces exerted by the metal STM tip on the nano-crystal during this nano-manipulation process could be determined by monitoring the deflection of the STM tip. After the lift-off process the former contact area was imaged using the STM. These STM micrographs clearly demonstrate that the region between the needles is covered by a P4P layer with a thickness of at least 3Â nm.
Related Topics
Physical Sciences and Engineering
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Physical and Theoretical Chemistry
Authors
K. Hänel, A. Birkner, S. Müllegger, A. Winkler, Ch. Wöll,