Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5427101 | Journal of Quantitative Spectroscopy and Radiative Transfer | 2017 | 5 Pages |
â¢We recorded high resolution EUV spectra of xenon with a compact EBIT.â¢Measured wavelengths with improved uncertainty.â¢Observed three new lines that were reported as unidentified lines in the literature.â¢Compared observed spectra with the previous results and found in good agreement.
We performed high resolution extreme ultraviolet (EUV) spectroscopy measurements of highly charged xenon ions with a compact electron beam ion trap. The spectra were recorded with a flat-field grazing incidence spectrometer while varying the electron beam energy between 200 and 890Â eV. We measured the wavelengths for several lines of Rh-like Xe9+ - Cd-like Xe6+ and Cu-like Xe25+- Se-like Xe20+ in the range of 150-200Â Ã with an uncertainty of 0.05Â Ã . Previously, most of these lines have been reported from EBITs with a wavelength uncertainty of 0.2Â Ã . Additionally, based on the electron beam energy dependence of the observed spectra we tentatively identified three new lines, which were reported as unidentified lines in the previous studies.