Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5430110 | Journal of Quantitative Spectroscopy and Radiative Transfer | 2009 | 10 Pages |
Abstract
We study light reflection from flat particles with rough surfaces and fractal statistics of topography. Discrete dipole approximation method is used to solve the problem of light scattering. Refractive indices corresponding to a metal and a transient material with conductive properties are taken. The sizes of particles are much larger than the wavelength of incident light and the roughness scales are larger, comparable to and smaller than the wavelength. The influence of the fractal dimension parameter and the amplitude of heights of random topography on reflectance and on the angular profile of the specular reflection peak is considered. Our calculations demonstrate that topography amplitude is very important for reflectance and fractal dimension is responsible for the angular dispersion of the specular reflection peak.
Related Topics
Physical Sciences and Engineering
Chemistry
Spectroscopy
Authors
Yevgen Grynko, Sorin Pulbere,