| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5430568 | Journal of Quantitative Spectroscopy and Radiative Transfer | 2008 | 8 Pages |
Abstract
The presence of small defects in micron-sized structured surfaces introduces small changes in the backscattering that can be assessed by means of an integrated parameter. In this work the influence of the optical properties of the substrate on this technique is analyzed for two different configurations: defect on the microstructure and defect on the substrate beside the microstructure.
Related Topics
Physical Sciences and Engineering
Chemistry
Spectroscopy
Authors
P. Albella, F. Moreno, J.M. Saiz, F. González,