Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5437775 | Ceramics International | 2017 | 7 Pages |
Abstract
Natural-superlattice-structured/intergrowth CaBi2Nb2O9-Bi4Ti3O12 (CBNO-BIT) ferroelectric thin films were successfully prepared via a magnetron sputtering process. XRD and TEM analysis revealed the [Bi2O2-(CaNb2O7)-Bi2O2-(Bi2Ti3O10)]n intergrowth structure of the film, as well as a (200)/(020) texture. XPS and EDS results confirmed that the film composition is close to the chemical stoichiometry. With its microstructure being successfully tailored at the nanoscale, the CBNO-BIT film exhibits good electrical properties, including a large dielectric constant (εr â¼390), a high piezoelectric coefficient (d33 â¼90 pm/V) as well as a high energy storage density (WE â¼76 J/cm3). Finally, the intergrowth nature of the film was verified by the measured temperature-dependent dielectric response (C-T).
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Caihong Xue, Xin Sun, Yunxiang Zhang, Yuyao Zhao, Hanfei Zhu, Qian Yang, Menglin Liu, Chunming Wang, Jun Ouyang,