Article ID Journal Published Year Pages File Type
5437833 Ceramics International 2017 7 Pages PDF
Abstract
In this study, (Ta0.5Sm0.5)xTi1−xO2 (x = 0, 0.02, 0.06, 0.15) ceramics (referred to as TSTO) were fabricated by a standard solid-state reaction. As revealed by the X-ray diffraction (XRD) spectra, the TSTOs exhibit a tetragonal rutile TiO2 structure. All the TSTO ceramics display colossal permittivity (~ 102-105). Moreover, the optimal ceramic, (Ta0.5Sm0.5)0.02Ti0.98O2, exhibits high performance over a wide temperature range from 20 °C to 160 °C. At 1 kHz, the dielectric constant and dielectric loss are 2.30 × 104 and 0.11 at 20 °C; they are 3.85 × 104 and 0.64 at 160 °C. Dielectric and impedance spectra analyses for the TSTO ceramics indicate that the CP behavior over a broad temperature range in (Ta+Sm) co-doped TiO2 could be explained by the internal barrier layer capacitance (IBLC) model, which consists of semiconducting grains and insulating grain boundaries.
Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
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