Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5438676 | Ceramics International | 2017 | 19 Pages |
Abstract
A polycrystalline SiC ceramic prepared by pressureless sintering of α-SiC powders with 3 vol% Al2O3-AlN-Y2O3 additives in an argon atmosphere exhibited a high electrical resistivity of ~1013 Ω cm at room temperature. X-ray diffraction revealed that the SiC ceramics consisted mainly of 6H- and 4H-SiC polytypes. Scanning electron microscopy and high resolution transmission electron microscopy investigations showed that the SiC specimen contained micron-sized grains surrounded by an amorphous Al-Y-Si-O-C-N film with a thickness of ~4.85 nm. The thick boundary film between the grains contributed to the high resistivity of the SiC ceramic.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Kwang Joo Kim, Jung-Hye Eom, Young-Wook Kim, Won-Seon Seo, Mi-Jai Lee, Sung Sic Hwang,