Article ID Journal Published Year Pages File Type
5441628 Journal of Science: Advanced Materials and Devices 2017 32 Pages PDF
Abstract
The NiO thin films were prepared by the electron beam evaporation method using synthesized sintered targets. As-prepared films were characterized using X-ray diffraction, scanning electron microscopy, UV-VIS spectroscopy and cyclic voltammetry. The thicker films were found to exhibit a well-defined structure and a well-developed crystallite size with greater transmittance modulation and durability. The as-deposited thinner films of 170 nm showed a faster response time during electrochromic cycles with a coloration efficiency of 53.1 C/cm2 than the thicker ones. However, the thicker films showed no enhanced electrochromic properties such as a larger intercalated charge than the thinner ones. The electrochromic properties of the thinner films became deteriorated after 800 cycling tests.
Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
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