Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5441628 | Journal of Science: Advanced Materials and Devices | 2017 | 32 Pages |
Abstract
The NiO thin films were prepared by the electron beam evaporation method using synthesized sintered targets. As-prepared films were characterized using X-ray diffraction, scanning electron microscopy, UV-VISÂ spectroscopy and cyclic voltammetry. The thicker films were found to exhibit a well-defined structure and a well-developed crystallite size with greater transmittance modulation and durability. The as-deposited thinner films of 170Â nm showed a faster response time during electrochromic cycles with a coloration efficiency of 53.1Â C/cm2 than the thicker ones. However, the thicker films showed no enhanced electrochromic properties such as a larger intercalated charge than the thinner ones. The electrochromic properties of the thinner films became deteriorated after 800 cycling tests.
Related Topics
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Authors
D.R. Sahu, Tzu-Jung Wu, Sheng-Chang Wang, Jow-Lay Huang,