| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5442397 | Optical Materials | 2017 | 4 Pages |
Abstract
New thallium based intrinsically activated scintillator for X-ray and gamma ray detection is reported. Luminescence and scintillation properties are measured under X-ray and γ-ray excitation sources at room temperature. This compound is grown from the melt using two zones vertical Bridgman method. X-ray induced emission spectrum exhibits intense luminescence band at 441 nm wavelength. Scintillation light yield and energy resolution are found to be 37,600 ± 3700 ph/MeV and 4.6% (FWHM), respectively under 662 keV excitation from 137Cs source. Two decay time constants are obtained when sample is excited by γ-ray at room temperature. Measured properties revealed that this compound is a potential scintillator and could be used as radiation detector in different applications.
Related Topics
Physical Sciences and Engineering
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Authors
Gul Rooh, Arshad Khan, H.J. Kim, H. Park, Sunghwan Kim,