A new method for unambiguous determination of trap parameters from afterglow and TSL curves connection: Example on garnets

In this paper, we develop procedures to determine trap parameters such as thermal trap depth and frequency factor in an unambiguous manner by connecting TSL and afterglow measurements. In order to accomplish that, we have devised a special method of extracting the lifetime of trapped carriers from afterglow measurements, independent of kinetic order. The procedures are first shown on simulated TSL and afterglow curves and then illustrated using (Y,Gd)3Al5O12:Ce garnets as example.