Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5444577 | Energy Procedia | 2017 | 8 Pages |
Abstract
Within this work, both the performance and reliability of industrial p-type monocrystalline solar cells with dielectrically passivated rear side and corresponding modules are investigated. Results of the mass production of Q.ANTUM solar cells at Hanwha Q CELLS on boron-doped p-type Czochralski-grown silicon (Cz-Si) substrates are presented, exceeding 21.5 % average conversion efficiency. Without power-enhancing measures such as the use of half cells, multi-wire approaches or light-capturing ribbons, essentially all currently (as of March 2017) produced Cz-Si Q.ANTUM solar modules exhibit output powers of > 300 Wp with 60 full 4-busbar cells. In terms of reliability, light-induced degradation (LID) is investigated in detail, with conditions relevant for the activation of, both, the boron-oxygen (BO) defect, and, so-called “Light and Elevated Temperature Induced Degradation” (LeTID). While the formation of the BO defect has been considered the most prominent LID mechanism in boron-doped p-type Cz-Si, LeTID has so far been discussed mainly as a potential issue for passivated emitter and rear cells (PERC) on multicrystalline silicon (mc-Si) substrates. This work shows that, if not adequately suppressed, LeTID can also occur in p-type Cz-Si PERC with a degradation in output power of up to > 6 %, which cannot be suppressed in a straightforward manner by conventional processing steps to permanently deactivate the BO defect. In contrast to conventional PERC, Hanwha Q CELLS' Q.ANTUM technology is shown to reliably suppress, both, LID due to BO defect formation, and, LeTID in modules manufactured from, both, p-type mc-Si and Cz-Si substrates.
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Authors
F. Fertig, R. Lantzsch, A. Mohr, M. Schaper, M. Bartzsch, D. Wissen, F. Kersten, A. Mette, S. Peters, A. Eidner, J. Cieslak, K. Duncker, M. Junghänel, E. Jarzembowski, M. Kauert, B. Faulwetter-Quandt, D. MeiÃner, B. Reiche, D.J.W. Jeong,