Non-Porod scattering and non-integer scaling of resistance in rough films

In many physical systems, films are rough due to the stochastic behavior of depositing particles. They are characterized by non-Porod power law decays in the structure factor S(k). Theoretical studies predict anomalous diffusion in such morphologies, with important implications for diffusivity, conductivity, etc. We use the non-Porod decay to accurately determine the fractal properties of two prototypical nanoparticle films: (i) Palladium (Pd) and (ii) Cu2O. Using scaling arguments, we find that the resistance of rough films of lateral size L obeys a non-integer power law R∼L−ζ, in contrast to integer power laws for compact structures. The exponent ζ is anisotropic. We confirm our predictions by re-analyzing experimental data from Cu2O nano-particle films. Our results are valuable for understanding recent experiments that report anisotropic electrical properties in (rough) thin films.