| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5447956 | Materials Chemistry and Physics | 2017 | 6 Pages |
Abstract
A study on crystalline silver indium tin oxide (AISO), a quaternary compound formed by tin incorporation in delafossite AgInO2 is briefed here. X-ray diffraction for structural characterization combined with energy dispersive analysis of X-rays for composition assessment confirms the formation of crystalline thin films with the rhomb-centered rhombohedral delafossite crystalline lattice. The variation in electrical conductivity (101-102Â S/cm) and activation energy are correlated with carrier concentration and c-axis orientation induced by stoichiometric changes. A band gap tuning from 2.38Â eV to 3.23Â eV is achieved by the stoichiometry changes.
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Authors
K. Keerthi, Bindu G. Nair, M.D. Benoy, Rakhy Raphael, Rachel Reena Philip,