| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5448951 | Optics Communications | 2018 | 5 Pages |
Abstract
We have employed a polarization-resolved Fourier-space surface plasmon resonance microscope to determine the electric field component ratio of surface plasmon polaritons (SPPs) propagating on a flat gold film. By using a metallic nanoparticle as a probe to capture the radiation damping of the SPP scattered waves, we find the angular far-field distribution is related to the transverse and longitudinal fields of SPPs. The experiment is supported by analytical and numerical calculations. Our results present a simple but useful approach to probe the behaviors of SPPs such as the transverse spin density as well as the energy density.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
C. Liu, H.C. Ong,