| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5449697 | Optics Communications | 2017 | 7 Pages |
Abstract
The formulas of image height in two-dimensional field about Gaussian and tilted imaging system of grating-based imaging spectrometer instrument (GISI) are deduced firstly, and the determined expressions of smile and keystone of GISI are obtained. It is proposed to correct the smile with off-axis lens, and the elimination effect of the smile is studied by means of spatial ray tracing. By controlling the degree of off-axis and the distribution of focal power of the off-axis lens, the long-wave infrared imaging spectrometer with well-eliminated smile and keystone is designed. The maximum of smile and keystone at working wavelengths in all fields of view are less than 8.57 µm and 13.33 µm, respectively.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Xiaolong Zhang, Kun Yu, Jun Zhang,