Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5450091 | Physica E: Low-dimensional Systems and Nanostructures | 2017 | 7 Pages |
Abstract
Cuprous oxide (Cu2O) nanocrystalline thin films were prepared on two types of substrates known as crystalline silicon and amorphous glass, by radio frequency reactive magnetron sputtering method. Scanning electron microscopy images confirmed that Cu2O particles covered the entire surface of both substrates with smoothing distribution. The root mean square surface roughness for the prepared Cu2O thin films on glass and Si (111) substrates is 4.16, and 3.36Â nm, respectively. Meanwhile, X-ray diffraction results demonstrated that the two phases of Cu2O and CuO were produced on Si (111) and glass substrates. The optical bandgap of Cu2O thin films synthesised on glass substrate is 2.42Â eV. Furthermore, the prepared Cu2O nanocrystalline thin films have showed low reflectance value in the visible spectrum. Metal-Semiconductor-Metal photodetector based Cu2O nanocrystalline thin films deposited onto Si (111) was fabricated using aluminium and platinum, with the current-voltage and photoresponse characteristic investigated under various applied bias voltages. The fabricated Metal-Semiconductor-Metal (M-S-M) photodetector had shown 126% sensitivity in the presence of 10Â mW/cm2 of 490Â nm light with 1.0Â V bias, displaying 90 and 100Â ms response and recovery times, respectively. These findings have demonstrated the suitability of M-S-M Cu2O photodetector as an affordable photosensor in the future.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Abbas M. Selman, M.A. Mahdi, Z. Hassan,