Achieve atomic resolution in in situ S/TEM experiments to examine complex interface structures in nanomaterials

Progress in recent research is briefly reviewed to highlight the potential when using latest S/TEM methodology optimized for atomic scale investigations and how this can be extended to in situ studies of interfacial effects, followed by comments on how to achieve and maintain highest possible resolution & sensitivity when keeping the effect of electron beam under control during these atomic-scale in situ experiments.