| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5451570 | Journal of Materials Science & Technology | 2017 | 11 Pages |
Abstract
The data of deformation strength and microstructure of thin films of nanocrystalline Pd recently provided by Colla et al. have been analysed. It is shown that the properties of the films with cylindrical grains of 30Â nm diameter extending over a significant portion of the film thickness (â90Â nm) are quantitatively comparable to what is known from nanocrystalline bulk material. This is explained in terms of boundary-mediated processes governing emission, storage, and recovery of dislocations.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Chemistry
Authors
W. Blum, P. Eisenlohr,