Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5454775 | Materials Characterization | 2017 | 7 Pages |
Abstract
C-axis oriented La0.67Sr0.33MnO3(LSMO)/PbZr0.52Ti0.48O3(PZT) films are fabricated successfully by sol-gel method on LaAlO3 (00l) substrates. The structure, composition and morphology of the films are investigated by X-ray diffractometer (XRD, θ-2θ scan, Ï-scan and Ï-scan), X-ray photoelectron spectroscope (XPS), field emission scanning electron microscope (FESEM) and high resolution transmission electron microscope (HRTEM). The electric and magnetic properties of randomly and c-axis oriented LSMO/PZT films are studied comparably using ferroelectric testing apparatus and physical property measurement system (PPMS). It is found that the epitaxial LSMO/PZT composite films show well controlled growth along c-axis, and much better magnetoelectric properties than the randomly oriented ones. The ME voltage coefficient increases from 23 mV cmâ 1 Oeâ 1 for the randomly oriented LSMO/PZT composite films to 52 mV cmâ 1 Oeâ 1 for c-axis oriented ones prepared using the low cost sol-gel method presented in this study, which shows high potential in promising applications.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Fuxue Yan, Kai Han, Gaoyang Zhao, Xiaojing Shi, Na Song, Zhichao Jiao,