Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5455629 | Materials Science and Engineering: A | 2017 | 17 Pages |
Abstract
Fatigue failure processes in metallic materials are closely related to the evolution of strain localisation under cyclic loading. Characterisation of this strain localisation is important in understanding the mechanisms of fatigue crack initiation and propagation, and provides critical validation data to develop appropriate crystal plasticity models for prediction of these processes. In this study, strain localisation during fatigue crack initiation and early crack propagation in an advanced Ni-based superalloy for turbine disc application has been characterised at the grain level with a sub-micron resolution by digital image correlation on SEM images using secondary γⲠthemselves as the speckle pattern. The obtained full-field strains have been analysed in global coordinates associated with the applied loading direction and in terms of the local coordinates associated with individual slip bands. Deformation arising from in-plane and out-of-plane dislocation slip can be identified by a combination of shear strain Éxy and transverse strain Éyy in the local slip band coordinates in combination with EBSD analysis. Cracks preferentially initiate from slip/strain bands adjacent and parallel to twin boundaries and then propagate along the slip/strain bands, leading to the onset of significant transverse strain Éyy in the local band coordinates as a consequence of crack opening. Crack propagation is closely related to strain accumulation at the crack tip which is determined by the grain orientation and grain size. Transverse strain Éyy in local slip band coordinates together with the inclination angle between dislocation slip direction on an activated {111} plane and the slip trace of this {111} plane at the specimen surface is proposed to be a cracking indicator/fracture criterion.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
R. Jiang, F. Pierron, S. Octaviani, P.A.S. Reed,