Thickness dependence of the electro-mechanical response of sputter-deposited Mo thin films on polyimide: Insights from in situ synchrotron diffraction tensile tests

Article ID	Journal	Published Year	Pages	File Type
5455744	Materials Science and Engineering: A	2017	25 Pages	PDF

Keywords

Flexible substrates Thin films Electrical resistance synchrotron diffraction Adhesion

Related Topics

Physical Sciences and Engineering Materials Science Materials Science (General)

Preview

$Thickness dependence of the electro-mechanical response of sputter-deposited Mo thin films on polyimide: Insights from in situ synchrotron diffraction tensile tests$

Authors

Tanja Jörg, Megan J. Cordill, Robert Franz, Christoph Kirchlechner, Daniel M. Többens, Jörg Winkler, Christian Mitterer,