Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5456995 | Micron | 2017 | 7 Pages |
Abstract
In this paper, we used Niggli reduced cell theory to determine lattice constants of a micro/nano crystal by using electron diffraction patterns. The Niggli reduced cell method enhanced the accuracy of lattice constant measurement obviously, because the lengths and the angles of lattice vectors of a primitive cell can be measured directly on the electron micrographs instead of a double tilt holder. With the aid of digitized algorithm and least square optimization by using three digitized micrographs, a valid reciprocal Niggli reduced cell number can be obtained. Thus a reciprocal and real Bravais lattices are acquired. The results of three examples, i.e., Mg4Zn7, an unknown phase (Precipitate phase in nickel-base superalloy) and Ba4Ti13O30 showed that the maximum errors are 1.6% for lengths and are 0.3% for angles.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Yi Yang, Canying Cai, Jianguo Lin, Lunjun Gong, Qibin Yang,