Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5457069 | Micron | 2017 | 19 Pages |
Abstract
A concise derivation of the principle of reciprocity applied to realistic transmission electron microscopy setups is presented making use of the multislice formalism. The equivalence of images acquired in conventional and scanning mode is thereby rigorously shown. The conditions for the applicability of the found reciprocity relations is discussed. Furthermore the positions of apertures in relation to the corresponding lenses are considered, a subject which scarcely has been addressed in previous publications.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Florian F. Krause, Andreas Rosenauer,