Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5458285 | Journal of Alloys and Compounds | 2017 | 10 Pages |
Abstract
Lead zirconate titanate (PZT) films prepared from a new chelate-based precursor solution were dip-coated onto ITO-coated glass substrates. ITO has been chosen to preserve the transparency necessary for the specific applications. The effects of chemistry and processing conditions are explored in solution-derived morphotropic composition PZT films. The PZT transformed directly from the amorphous phase into perovskite, without going through a pyrochlore intermediate stage. The PZT phase crystallized at significantly low temperature of 450 °C following conventional heat-treatment without necessitating special irradiations, rapid thermal annealing and/or particular substrates. Ferroelectric and dielectric properties were measured and compared for PZT films processed from two sol-gel precursor systems. A remanent polarization, Pr, of 7.5 μC cmâ2, coercive field, Ec, of 18.7 kV cmâ1, dielectric constant, εr, of 739, and loss value, tan(δ), of 0.04 were measured for PZT film post-annealed at 700 °C.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Radhouane Bel-Hadj-Tahar,