Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5458343 | Journal of Alloys and Compounds | 2017 | 24 Pages |
Abstract
MoS2 atomic layers with a lateral grain size of 50-100 μm were synthesized by a new two-step chemical vapor deposition method. The product was confirmed to be bilayer MoS2 by the characterization of Raman spectroscopy, atomic force microscopy and high-resolution transmission electron microscopy. The growth mechanism and the influencing factors during the growth process of the bilayer MoS2 were proposed and the so-obtained large lateral grain sizes of MoS2 atomic layers were attributed to the high surface mobility and enhanced surface evaporation. The resistive gas sensors based on as-prepared bilayer MoS2 films showed a p-type character and achieved a superior sensitivity of 2.6% to 1 ppm NO2 gas at room temperature.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Tingting Xu, Yongyong Pei, Yunyun Liu, Di Wu, Zhifeng Shi, Junmin Xu, Yongtao Tian, Xinjian Li,