Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5461168 | Journal of Alloys and Compounds | 2017 | 19 Pages |
Abstract
We investigated the influence of AlN interlayer with varied V/III ratio on the impurity incorporation of GaN films grown on sputtered AlN layer by metal organic chemical vapor deposition (MOCVD). It is found that the V/III ratio of AlN interlayer significantly influences on the growth mode and leads different impurity distribution and electron properties. In the case of AlN interlayer with an optimized V/III ratio, incorporation of oxygen impurity in GaN epitaxial films is suppressed. Leading to the GaN film shows a high sheet resistivity. However, at a lower V/III ratio, an unexpected three-dimensional growth mode plays dominant role. While at a higher V/III ratio, the GaN polarity would invert to N-polar. Both these two situations would deteriorate the electrical properties of GaN film.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Zhibin Chen, Jincheng Zhang, Shengrui Xu, Junshuai Xue, Jiaduo Zhu, Teng Jiang, Yue Hao,