| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5462887 | Materials Letters | 2017 | 18 Pages |
Abstract
Although the observed XRD pattern indicates that the IGZO films are amorphous structures, the surface roughness and electrical conductivity increased as the thickness of the Ni interlayer increased. In addition, the rough surface and enhanced carrier density of the films due to the Ni interlayer results in the decreased visible transmittance and low emissivity of the films.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Young-Hwan Song, Tae-Young Eom, Sung-Bo Heo, Joo-Yong Cheon, Byung-Chul Cha, Daeil Kim,