Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5463978 | Materials Letters | 2017 | 8 Pages |
Abstract
Cu and Ni films with thickness ranging from 10 to 200Â nm were sputter deposited and their electrochemical impedance was investigated by impedance spectrum to develop the relationship between thickness of thin film electrodes and interface electrochemistry. Both charge transfer resistance and double layer capacitance of the film electrodes decreased with increase in thickness of the thin film electrodes. The current work provided further understanding on interface electrochemistry of thin film electrodes and served as guidance for the design of high performance miniature electrochemical devices.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Shulan Wang, Jiulong Li, Rongxia Zhang, Li Li,