| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5464147 | Materials Letters | 2017 | 13 Pages |
Abstract
Electron backscatter diffraction was applied to examine the microstructure developed in commercial-purity titanium subjected to equal channel angular pressing at 200 °C to a true strain of 8.4. The microstructure was characterized by a mean grain size of 0.4 μm and fraction of high-angle boundaries of 55%. However, it also contained a significant fraction of relatively coarse (>1 μm) remnants of original grains. A microstructure-properties analysis indicated that strengthening effect of ECAP was essentially contributed by substructure.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
G.S. Dyakonov, S. Mironov, I.P. Semenova, R.Z. Valiev, S.L. Semiatin,