Article ID Journal Published Year Pages File Type
5465171 Surface and Coatings Technology 2016 6 Pages PDF
Abstract
Anatase films were deposited on glass substrates by 180, 300, 450 and 500 W microwave for 1.5 min. Upon calcination the 450 and 500 W films at 450 °C for 1 h, additional rutile phase was detected by X-ray diffraction (XRD). Scanning electron microscopy (SEM) and atomic force microscopy (AFM) analyses revealed morphologies of the films which were composed of a number of nanoparticles orientated in different directions with the lowest roughness for the film synthesized by 450 W microwave combined with the high temperature calcination. Band gaps of the films without calcination determined by UV-visible spectroscopy were 3.30-3.35 eV and were considerably decreased to 2.92-3.20 eV by the high temperature calcination.
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Physical Sciences and Engineering Materials Science Nanotechnology
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