Article ID Journal Published Year Pages File Type
5465894 Thin Solid Films 2017 21 Pages PDF
Abstract
Transparent, luminescent thin films of Dy3 +-doped GdVO4 were fabricated by pulsed laser deposition technique on quartz substrates. Thin film structure, morphology and optical properties were investigated and discussed in detail. X-ray analysis shows relatively intense reflection peaks confirming that as-deposited films are highly crystalline with strong (200) preferred orientation. Cross-sectional scanning electron microscopy shows relatively dense film with an average thickness of ~ 340 nm. Band gap of Dy3 +-doped GdVO4 thin film, estimated from diffuse reflectance spectrum, is 3.61 eV. Refractive index and extinction coefficient of thin films as a function of wavelength are extracted from ellipsometric spectra. The photoluminescent emission spectra have two dominant bands: one in the yellow (~ 573 nm, 4F9/2 → 6H13/2 transition) followed by the other in the blue (~ 484 nm, 4F9/2 → 6H15/2 transition) region resulting in the emission color placed in the white light region.
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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