Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
5465894 | Thin Solid Films | 2017 | 21 Pages |
Abstract
Transparent, luminescent thin films of Dy3 +-doped GdVO4 were fabricated by pulsed laser deposition technique on quartz substrates. Thin film structure, morphology and optical properties were investigated and discussed in detail. X-ray analysis shows relatively intense reflection peaks confirming that as-deposited films are highly crystalline with strong (200) preferred orientation. Cross-sectional scanning electron microscopy shows relatively dense film with an average thickness of ~ 340 nm. Band gap of Dy3 +-doped GdVO4 thin film, estimated from diffuse reflectance spectrum, is 3.61 eV. Refractive index and extinction coefficient of thin films as a function of wavelength are extracted from ellipsometric spectra. The photoluminescent emission spectra have two dominant bands: one in the yellow (~ 573 nm, 4F9/2 â 6H13/2 transition) followed by the other in the blue (~ 484 nm, 4F9/2 â 6H15/2 transition) region resulting in the emission color placed in the white light region.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Željka AntiÄ, K. Prashanthi, Dragana JovanoviÄ, Kaveh Ahadi, Miroslav D. DramiÄanin, Thomas Thundat,