| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 5466427 | Thin Solid Films | 2017 | 5 Pages |
Abstract
In this work, we determine the dielectric functions of multi-target, reactively sputtered Ba(Zr0·2Ti0.8)O3 by spectroscopic ellipsometry in the photon energy range from 0.8 to 8.7 eV. Based on this data, we discuss the interband transition energies and the spectral dependencies of the refractive index and the absorption coefficient.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
G. Suchaneck, E. Chernova, A. Kleiner, R. Liebschner, L. JastrabÃk, D.C. Meyer, A. Dejneka, G. Gerlach,